01 Record index
TEE_Malloc in Samsung mTower through 0.3.0 allows a trusted application to achieve Excessive Memory Allocation via a large len value, as demonstrated by a Numaker-PFM-M2351 TEE kernel crash.
TEE_Malloc in Samsung mTower through 0.3.0 allows a trusted application to achieve Excessive Memory Allocation via a large len value, as demonstrated by a Numaker-PFM-M2351 TEE kernel crash.
Exploit-prediction scores from FIRST. Independent scoring and analysis status from the NVD. Vendor severity from Red Hat. Exploitation assessment and catalog membership from CISA.